Search results for: Rongmei Chen
Journal of Molecular Histology > 2019 > 50 > 1 > 11-19
Microelectronics Reliability > 2018 > 87 > C > 151-157
IEEE Transactions on Nuclear Science > 2017 > 64 > 9 > 2511 - 2518
Microelectronics Reliability > 2017 > 71 > Complete > 99-105