Search results for: D.C. Gilmer
Springer Series in Advanced Microelectronics
Solid-State Electronics > 2015 > 111 > C > 161-165
Microelectronic Engineering > 2013 > 109 > Complete > 75-78
2012 IEEE International Reliability Physics Symposium (IRPS) > 6C.4.1 - 6C.4.5
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 898 - 904
IEEE Electron Device Letters > 2009 > 30 > 3 > 285 - 287
IEEE Electron Device Letters > 2009 > 30 > 3 > 216 - 218