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In semiconductor technologies thermally and electrically conductive adhesives are widely used to attach the die to the substrate. Focus of this work are Isotropic Conductive Adhesives (ICA) with a high amount of electrically conductive filler particles and the characterization of such materials.
New die attach technologies are necessary to meet the demand for faster and more reliable power electronic devices. Technologies based on sintering such as silver sintering and silver sinter adhesives are currently in the focus of technology development because of their high strength and very high thermal performance. To ensure the reliability of such a die attach reliable, fast and non-destructive...
This paper deals with the development of an innovative test stand for the measurement of thermal and electrical conductivity of metals, semiconductors, highly conductive die attaches and substrates using the steady state technique for thermal characterization and four-terminal sensing with pulse delta technique for electrical characterization. We present a systematic study of sintered silver in order...
Electrically conductive adhesives are widely used in semiconductor technology. The focus of this work is set on Isotropic Conductive Adhesives (ICA) with a high amount of electrically conductive filler particles. The aim of this work is the material characterization of highly filled epoxy based die attaches materials by dynamic mechanical analysis (DMA) and relaxation experiments in order to derive...
This paper deals with the development of a new test stand for determination the thermal conductivity of metals, semiconductors, highly conductive die attaches and substrates using the steady state technique. We designed the test stand and optimized it by FE simulation to have flexibility for the selection of the sample size and measurement parameters. We determine the thermal conductivity from the...
The stress sensing system, which has been developed recently, allows measuring the magnitudes and the distribution of mechanical stresses induced in the silicon dies during fabrication and testing of the electronic packages. The studies already presented in the last years focused on the effects of temperature cycling, 4-point-bending, moisture swelling, and molding. This paper reports the results...
This paper deals with the system design, technology and test of a novel concept of integrating silicon power dies along with thermo-electric coolers and a phase change heat buffer in order to thermally manage transients occurring during operation. The innovative power-electronics concept features double-sided cooling as well as new materials and joining technologies to integrate the dies such as transient...
This paper introduces a miniaturized frictionless fan concept, which is similar to a piezo-electric driven fan principle. This type of fan has been employed for the enhancement of heat transfer by increasing the fluid circulation in regions which are otherwise stagnant.
Bulk material fracture and interface delamination are main failure modes observed in microelectronic components. Drivers are stresses during processing (e.g. soldering), testing (e.g. moisture sensitivity, thermal cycling) and operation in application environments. For quantitative modeling to predict failures the fracture toughness expressed as critical energy release rate Gc has to be known by measurements...
Interlayer cooling removes the heat dissipated by vertically stacked chips in multiple integrated fluid cavities. Its performance scales with the number of dies in the stack and is therefore superior to traditional back-side heat removal. Previous work indicated that pin-fin arrays are ideally suited as through-silicon-via-compatible heat transfer structures. In addition, four-port fluid-delivery...
Thermal interface materials (TIMs) are widely needed to improve thermal contacts for facilitation heat transfer in electronic packaging, such as that associated with the flow of heat from microprocessor to a heat spreader or a heat sink in a computer. Due to thermal mismatch between these components mechanical strain occur which cause pump-out, cracks or delamination of TIM. In order to qualify the...
One major challenge for power and microelectronics system integration today is the assurance of reliability, very often mastered by a carefully tuned interplay of the still dissimilar materials that make up a package, first under optimized processing conditions, and then often under combined loading conditions. Therefore, not only during design but also during test and operation it would be desirable...
As the demand for new thermal technologies and materials has been increasing over the years to provide thermal solutions to the next generation of power electronics, microprocessors and high-power optical systems also thermal characterisation methods have to keep up with the pace of this development with respect to resolution and accuracy. We have developed both bulk and interface technologies to...
Nowadays very often IR-thermography is used to analyze the temperature on electronic device surfaces. To measure the absolute surface temperature correctly, the IR-camera detector has to be calibrated with a corresponding evaluation software using a black body calibration device. Commercially available black radiators are heavyweight and a calibration of macrolenses is not possible due to mismatch...
The present study deals with experimental investigation of the delamination toughness of EMC (epoxy molding compound) and Copper-leadframe interfaces. Test samples were directly obtained from the production line. EMC is attached on copper substrates with various surface treatments. Mixed mode bending experiments were performed under various temperature and moisture environments. The test procedure...
The ongoing need for miniaturization and speed in electronics industry has brought a requirement for better performing thermal management systems. One of the major bottlenecks in thermal management is the thermal interface resistance. Characterisation of thermal interface materials become even tougher a challenge at low bond line thicknesses and higher thermal conductivities of the interface materials...
Nowadays very often IR-thermography is used to analyze the temperature on electronic device surfaces. To measure the absolute surface temperature correctly, the IR-camera detector has to be calibrated with an corresponding evaluation software using a black body calibration device. Commercially available black radiators are heavyweight and a calibration of macro-lenses is not possible due to mismatch...
Interfacial delamination has become one of the key reliability issues in the microelectronics of portable devices and therefore is getting more and more attention. The analysis of delamination of a laminate structure with a crack along the interface is central to the characterization of interfacial toughness. Due to the mismatch in mechanical properties of the materials adjacent to the interface and...
Interfacial delamination is known as one of the root causes of failure in microelectronic industry. In order to explore the risk of interface damage, FE simulations for the fabrication steps as well as for the testing conditions are generally made in the design stage. In order to be able to judge the risk for interface fracture, the critical fracture properties of the interfaces being applied should...
This paper addresses the potential of molecular dynamics simulation for structure-property correlations in epoxy-resins. This is an important topic within a multi-scale framework to lifetime prediction in electronic packaging. For that purpose, epoxy-resins with small systematic variations in chemical structure have been synthesised and then characterised by various thermo-mechanical testing methods...
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