Search results for: S Takagi
2016 IEEE International Electron Devices Meeting (IEDM) > 12.5.1 - 12.5.4
2013 IEEE International Electron Devices Meeting > 26.1.1 - 26.1.4
2013 IEEE International Electron Devices Meeting > 16.4.1 - 16.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
2010 International Electron Devices Meeting > 3.1.1 - 3.1.4
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2057 - 2066
2009 IEEE Custom Integrated Circuits Conference > 153 - 160
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2386 - 2396
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2397 - 2402