Search results for: S Mahapatra
2011 International Reliability Physics Symposium > 6A.3.1 - 6A.3.10
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980
IEEE Electron Device Letters > 2009 > 30 > 2 > 152 - 154
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 236 - 242
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 35 - 46
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2614 - 2622
2007 IEEE International Electron Devices Meeting > 809 - 812
IEEE Transactions on Electron Devices > 2007 > 54 > 7 > 1672 - 1680