Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 570 - 576
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3519 - 3523
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 642 - 645
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 2002 - 2010
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1996 > 4 > 3 > 307 - 321