Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 642 - 645
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2476 - 2486
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3149 - 3159
2009 31st EOS/ESD Symposium > 1 - 6
IEEE Transactions on Circuits and Systems II: Express Briefs > 2009 > 56 > 5 > 359 - 363
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1466 - 1472
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 394 - 405
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 549 - 560
IEEE Transactions on Electron Devices > 2007 > 54 > 4 > 840 - 851
IEEE Transactions on Circuits and Systems II: Express Briefs > 2007 > 54 > 1 > 47 - 51
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 324 - 332
IEEE Journal of Solid-State Circuits > 2007 > 42 > 5 > 1158 - 1168