Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 5 > 1039 - 1047
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3149 - 3159
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1774 - 1779
2009 31st EOS/ESD Symposium > 1 - 6
IEEE Transactions on Circuits and Systems II: Express Briefs > 2009 > 56 > 5 > 359 - 363
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2533 - 2545
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1409 - 1416
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1996 > 4 > 3 > 307 - 321