Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 570 - 576
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3519 - 3523
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 642 - 645
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4145 - 4152
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 493 - 498
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
2009 31st EOS/ESD Symposium > 1 - 6
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1204 - 1210
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 1 > 13 - 21