Search results for: H Nohira
Materials Science in Semiconductor Processing > 2017 > 70 > C > 260-264
Microelectronics Reliability > 2016 > 60 > C > 16-19
Enantiomer Separation > 165-191
Journal of Electron Spectroscopy and Related Phenomena > 2013 > 190 > Part B > 295-301
Solid State Electronics > 2013 > 82 > Complete > 29-33
2010 International Electron Devices Meeting > 2.3.1 - 2.3.4
Microelectronics Reliability > 2010 > 50 > 3 > 356-359
Progress in Surface Science > 2007 > 82 > 1 > 3-54
Microelectronics Reliability > 2007 > 47 > 1 > 20-26
Nuclear Inst. and Methods in Physics Research, A > 2005 > 547 > 1 > 50-55