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Low cost diagnosis of RF systems has become an important problem due to increased process variability effects on the performance of RF devices and the need to ramp-up RF IC yield rapidly. In the recent past, there has been work on diagnosing RF device model parameters from random “frequency-rich” test stimulus. In this paper, we develop a novel test stimulus generation approach which produces a compact,...
Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune...
In this paper, a novel methodology for post manufacture tuning of RF circuits is presented. The procedure uses an iterative test-tune-test algorithm that applies a compact alternative test to the DUT and modulates circuit level tuning knobs (bias/supply values) based on the DUT specification values predicted from the test. The test procedure is repeated until convergence to the desired spec values...
Voltage overscaling for power reduction in RF systems has been limited by the need to maintain sufficient overscaling guard bands to ensure that minimum signal quality requirements of the end to end communication link are met. In this paper, we propose error control mechanisms at the symbol (probabilistic symbol remapping) and bit levels (code based correction and feedback) that allow more aggressive...
In this paper, a novel adaptive calibration technique for advanced RF front-ends is proposed in which sensors are implanted in the transmitter and the observed device test response to a special calibration test is compared against the known golden response to the same. Tuning 'knobs' which are built into the circuit are then used to minimize the error between the observed response and the golden response...
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