Search results for: Yuan Lu
IEEE Electron Device Letters > 2017 > 38 > 1 > 48 - 51
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2218 - 2228
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Electron Device Letters > 2007 > 28 > 9 > 828 - 830