Search results for: Yuan Lu
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351