Search results for: M. Dammann
Microelectronics Reliability > 2017 > 76-77 > C > 566-570
Microelectronics Reliability > 2017 > 76-77 > C > 292-297
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 598 - 605
IEEE Microwave and Wireless Components Letters > 2015 > 25 > 8 > 526 - 528
Microelectronics Reliability > 2015 > 55 > 9-10 > 1667-1671
2015 IEEE International Reliability Physics Symposium > CD.2.1 - CD.2.5
Acta Physica Polonica A > 2014 > 125 > 4 > 982-985
Microelectronics Reliability > 2013 > 53 > 9-11 > 1439-1443
Regulatory Toxicology and Pharmacology > 2012 > 64 > 1 > 1-8
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.6.1 - CD.6.5
Regulatory Toxicology and Pharmacology > 2011 > 59 > 1 > 81-90
Microelectronics Reliability > 2011 > 51 > 2 > 224-228
physica status solidi c > 7 > 10 > 2398 - 2403