Search results for: M. Baeumler
Microelectronics Reliability > 2017 > 76-77 > C > 292-297
Microelectronics Reliability > 2015 > 55 > 9-10 > 1667-1671
Acta Physica Polonica A > 2014 > 125 > 4 > 982-985
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.6.1 - CD.6.5
Acta Physica Polonica A > 2011 > 120 > 5 > 918-920
Materials Science & Engineering B > 2002 > 91-92 > 16 - 20
Materials Science & Engineering B > 2002 > 91-92 > 29 - 32
Journal of Crystal Growth > 2000 > 210 > 1-3 > 207-211
Applied Physics A > 2000 > 70 > 4 > 377-381
Materials Science & Engineering B > 1999 > 66 > 1-3 > 131-140
Materials Science & Engineering B > 1999 > 66 > 1-3 > 209-214