Search results for: S. Okhonin
2007 IEEE International Electron Devices Meeting > 925 - 928
Solid State Electronics > 2002 > 46 > 11 > 1709-1713
Microelectronic Engineering > 2001 > 59 > 1-4 > 469-473
Microelectronics Reliability > 1996 > 36 > 11-12 > 1671-1674
Microelectronic Engineering > 1995 > 28 > 1-4 > 261-264