Search results for: M. Rahimo
Microelectronics Reliability > 2017 > 76-77 > C > 485-489
Microelectronics Reliability > 2017 > 76-77 > C > 495-499
IEEE Electron Device Letters > 2016 > 37 > 9 > 1178 - 1180
Microelectronics Reliability > 2016 > 64 > C > 524-529
IEEE Electron Device Letters > 2016 > 37 > 4 > 467 - 470
IEEE Electron Device Letters > 2015 > 36 > 8 > 823 - 825
IEEE Electron Device Letters > 2015 > 36 > 5 > 487 - 489
IEEE Electron Device Letters > 2012 > 33 > 11 > 1601 - 1603