Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 549 - 555
EOS/ESD Symposium Proceedings > 1 - 6
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2476 - 2486
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 4 > 810 - 821