Search results for: Ming-Dou Ker
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246
2009 IEEE Custom Integrated Circuits Conference > 539 - 542
2008 IEEE Asian Solid-State Circuits Conference > 409 - 412
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 4 > 810 - 821