Search results for: J. Yoo
Electronics Letters > 2017 > 53 > 12 > 793 - 795
2016 IEEE International Electron Devices Meeting (IEDM) > 6.7.1 - 6.7.3
Electronics Letters > 2017 > 53 > 12 > 793 - 795
2016 IEEE International Electron Devices Meeting (IEDM) > 6.7.1 - 6.7.3