Search results for: C. Claeys
Thin Solid Films > 2010 > 518 > 9 > 2301-2306
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2257 - 2263
Thin Solid Films > 2010 > 518 > 9 > 2301-2306
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2257 - 2263