Search results for: Y. Hayashi
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1852 - 1861
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1579 - 1587
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 2 > 256 - 262
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 3 > 469 - 480
2007 IEEE International Electron Devices Meeting > 989 - 992
2007 IEEE International Electron Devices Meeting > 973 - 976
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1867 - 1877