Search results for: Hyoung-Kook Kim
Journal of Electronic Testing > 2013 > 29 > 1 > 49-72
Journal of Electronic Testing > 2010 > 26 > 3 > 367-392
Journal of Electronic Testing > 2013 > 29 > 1 > 49-72
Journal of Electronic Testing > 2010 > 26 > 3 > 367-392