Search results for: E. Beigne
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-6.1 - CR-6.6
2014 IEEE International Electron Devices Meeting > 9.2.1 - 9.2.4
10th IEEE International NEWCAS Conference > 457 - 460
DAC Design Automation Conference 2012 > 1049 - 1054
Microelectronics Journal > 2011 > 42 > 5 > 718-732