Search results for: I. Polian
IEEE Design & Test of Computers > 2011 > 28 > 3 > 54 - 63
IEEE Transactions on Dependable and Secure Computing > 2011 > 8 > 4 > 537 - 547
2010 East-West Design&Test Symposium (EWDTS) > 376 - 381
IEEE Design & Test of Computers > 2011 > 28 > 3 > 54 - 63
IEEE Transactions on Dependable and Secure Computing > 2011 > 8 > 4 > 537 - 547
2010 East-West Design&Test Symposium (EWDTS) > 376 - 381