Search results for: Mansun Chan
Microelectronics Reliability > 2010 > 50 > 12 > 1907-1914
Solid State Electronics > 2010 > 54 > 8 > 806-808
Microelectronics Reliability > 2010 > 50 > 8 > 1062-1070
Solid State Electronics > 2010 > 54 > 8 > 791-795
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2404 - 2420
2010 3rd International Nanoelectronics Conference (INEC) > 1130 - 1131
IEEE Transactions on Nanotechnology > 2010 > 9 > 3 > 268
Microelectronics Reliability > 2009 > 49 > 8 > 897-903