Search results for: C. Metra
Journal of Electronic Testing > 2019 > 35 > 2 > 253-260
Journal of Electronic Testing > 2014 > 30 > 1 > 111-123
Journal of Electronic Testing > 2013 > 29 > 3 > 401-413
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 12 > 2322 - 2325
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 8 > 1161 - 1166
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2009 > 28 > 6 > 915 - 925