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As the first study on statistical 3D thermal analysis, we propose an efficient method for fewer over-hot spots. The new method, called SN-SOR (single-node SOR), is based on a novel localized relaxed iterative approach and it can perform statistical analysis on one over-hot spot at a time. Experiments show that SN-SOR is 590X faster than Monte-Carlo method with small errors and is 29X faster than general...
Due to decreasing supply voltages and increasing power consumption of today's VLSI chips, IR drops on on-chip power/ground (P/G) grids have to be explicitly considered during floorplanning stage in the today's physical design flow. It is therefore very important to adjust the double-mesh P/G grids in the floorplanning for efficiently minimizing the worst-case IR drop subject to limited routing resource...
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