Search results for: S. Decoutere
Microelectronics Reliability > 2017 > 76-77 > C > 298-303
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-4.1 - 4B-4.9
physica status solidi (a) > 214 > 3 > n/a - n/a
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-5-1 - CD-5-4
2015 IEEE International Electron Devices Meeting (IEDM) > 16.2.1 - 16.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
Solid State Electronics > 2015 > 113 > Complete > 9-14
Microelectronics Reliability > 2015 > 55 > 9-10 > 1692-1696
Microelectronics Reliability > 2014 > 54 > 9-10 > 2196-2199
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.7
IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 3 > 361 - 367
Microelectronics Reliability > 2012 > 52 > 9-10 > 2188-2193
2011 International Electron Devices Meeting > 19.6.1 - 19.6.4
Microelectronics Reliability > 2011 > 51 > 9-11 > 1717-1720