Search results for: Jian-Hsing Lee
IEEE Electron Device Letters > 2017 > 38 > 11 > 1583 - 1585
IEEE Electron Device Letters > 2017 > 38 > 7 > 952 - 954
IEEE Electron Device Letters > 2017 > 38 > 5 > 623 - 625
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-1.1 - PM-1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1201 - 1203
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-2-1 - EL-2-5
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4135 - 4138
2015 IEEE International Reliability Physics Symposium > 3F.3.1 - 3F.3.6
2015 IEEE International Reliability Physics Symposium > PR.2.1 - PR.2.5
2015 IEEE International Reliability Physics Symposium > EL.5.1 - EL.5.5
2015 IEEE International Reliability Physics Symposium > EL.6.1 - EL.6.5