Search results for: C.D. Young
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 626 - 631
IEEE Electron Device Letters > 2008 > 29 > 2 > 180 - 182
IEEE Electron Device Letters > 2007 > 28 > 8 > 734 - 736
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Electron Device Letters > 2006 > 27 > 8 > 662 - 664
IEEE Electron Device Letters > 2006 > 27 > 12 > 984 - 987