Search results for: P. Campbell
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1489 - 1497
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3851 - 3856
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3605 - 3613
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-4-1 - XT-4-4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2943 - 2949
IEEE Electron Device Letters > 2011 > 32 > 8 > 1047 - 1049