Search results for: Adelmo Ortiz-Conde
Microelectronics Reliability > 2017 > 69 > C > 1-16
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3844 - 3850
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1821 - 1826
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3554 - 3559
Microelectronics Reliability > 2015 > 55 > 2 > 293-307
Solid State Electronics > 2014 > 93 > Complete > 49-55
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 12-2 > 3255 - 3261
Solid State Electronics > 2013 > 89 > Complete > 7-11
IEEE Journal of Photovoltaics > 2013 > 3 > 1 > 330 - 335
Microelectronics Reliability > 2013 > 53 > 1 > 90-104
Solid State Electronics > 2012 > 76 > Complete > 112-115
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2390 - 2395
IEEE Transactions on Electron Devices > 2012 > 59 > 1 > 46 - 50
Microelectronics Reliability > 2011 > 51 > 12 > 2044-2048
Solid State Electronics > 2011 > 57 > 1 > 43-51
Microelectronics Reliability > 2010 > 50 > 2 > 312-315
Microelectronics Reliability > 2009 > 49 > 7 > 689-692
Solid State Electronics > 2008 > 52 > 7 > 1092-1098