Search results for: T. Smedes
Microelectronics Reliability > 2013 > 53 > 2 > 190-195
EOS/ESD Symposium Proceedings > 1 - 7
Microelectronics Reliability > 2009 > 49 > 9-11 > 941-945
2009 31st EOS/ESD Symposium > 1 - 9
Microelectronics Reliability > 2007 > 47 > 7 > 1000-1007
Journal of Electrostatics > 2002 > 56 > 3 > 399-414