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The photoplethysmographic (PPG) signal is an important source of information for estimating heart rate (HR). However, the PPG signal could be strongly contaminated by the motion artifact of the subjects, making HR estimation a particularly difficult problem. In this paper, we propose PARHELIA, a PARticle filter-based algorithm for HEart rate estimation using photopLethysmographIc signAls. The proposed...
The relentless technology scaling calls for reduced supply voltage for dynamic power suppression. On the other hand, transistor threshold voltage cannot be scaled at the same pace to avoid excessive leakage power. Consequently, the noise margin is significantly reduced, leading to the deployment of various noise management systems that handle runtime voltage emergencies. Most of these systems rely...
Post-fabrication performance compensation and adaptive delay testing are indispensable means for improving yield and reliability of LSIs, The global parameter estimations, such as of threshold voltages, play a key role in maximizing their effectiveness. This paper proposes a novel technique that realizes an accurate device-parameter estimation through Fmax testing framework. In the proposed method,...
Sub- and near-threshold circuits have been attracting growing interests because they are suitable for realizing extremely low power and low energy circuits. The estimation of the minimum operating voltage (VDDmin), under which the circuit does not function correctly, is one of the most important issues in their design. In this paper, the distribution of VDDmin is explored through simulations and measurements...
Post-fabrication performance compensation and adaptive delay testing are effective means to improve yield and reliability of LSIs. In these methods, process parameter estimation plays a key role. In this paper, we propose a novel technique for accurate on-chip process parameter estimation. The proposed technique is based on Bayes' theorem, in which on-chip parameters, such as threshold voltages, are...
Monte Carlo simulations have been widely adopted for analyzing circuit properties, such as SRAM yield, under strong influence of process variations. Enormous calculation time is required in such a simulation due to the low defect probabilities. In this paper, we propose a robust shift-vector determination for mean-shift importance sampling, by which efficiency and stability of the Monte Carlo simulation...
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