Search results for: X.F. Ang
Microelectronics Reliability > 2012 > 52 > 2 > 321-324
Journal of Electronic Materials > 2012 > 41 > 9 > 2533-2542
Thin Solid Films > 2008 > 516 > 16 > 5721-5724
Thin Solid Films > 2006 > 504 > 1-2 > 379-383
Thin Solid Films > 2006 > 504 > 1-2 > 367-370