Search results for: Minseok Ha
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2548 - 2555
Microelectronics Reliability > 2012 > 52 > 5 > 836-844
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2548 - 2555
Microelectronics Reliability > 2012 > 52 > 5 > 836-844