Search results for: R. Degraeve
2011 International Electron Devices Meeting > 12.4.1 - 12.4.4
2011 International Electron Devices Meeting > 31.6.1 - 31.6.4
2011 International Reliability Physics Symposium > 3A.5.1 - 3A.5.6
2011 International Reliability Physics Symposium > MY.1.1 - MY.1.4
2011 International Reliability Physics Symposium > 2A.2.1 - 2A.2.10
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
2010 International Electron Devices Meeting > 28.4.1 - 28.4.4
Microelectronic Engineering > 2010 > 87 > 12 > 2614-2619
International Journal of Numerical Modelling: Electronic Networks, Devices... > 23 > 4‐5 > 315 - 323
2010 IEEE International Reliability Physics Symposium > 1095 - 1098
2010 IEEE International Reliability Physics Symposium > 1078 - 1081