Search results for: R. Degraeve
IEEE Electron Device Letters > 2015 > 36 > 8 > 775 - 777
IEEE Electron Device Letters > 2015 > 36 > 8 > 769 - 771
2014 IEEE International Electron Devices Meeting > 14.2.1 - 14.2.4
Microelectronics Reliability > 2014 > 54 > 9-10 > 1675-1679
2014 IEEE International Reliability Physics Symposium > MY.1.1 - MY.1.5
2014 IEEE International Reliability Physics Symposium > 3C.4.1 - 3C.4.6
2014 IEEE International Reliability Physics Symposium > 2E.3.1 - 2E.3.6
2013 IEEE International Electron Devices Meeting > 21.3.1 - 21.3.4
2013 IEEE International Electron Devices Meeting > 21.2.1 - 21.2.4
2013 IEEE International Electron Devices Meeting > 21.1.1 - 21.1.4