Search results for: S. Voldman
IEEE Nanotechnology Magazine > 2009 > 3 > 3 > 12 - 15
Journal of Electrostatics > 2002 > 54 > 1 > 3-21
Microelectronics Reliability > 2001 > 41 > 3 > 335-348
Journal of Electrostatics > 2000 > 49 > 3-4 > 151-168
Microelectronics Reliability > 1998 > 38 > 1 > 145-152
Journal of Electrostatics > 1998 > 42 > 4 > 333-350
IEEE Transactions on Nuclear Science > 1984 > 31 > 6 > 1196 - 1200