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This paper describes a test response compaction system that preserves diagnostic information and enables performing a test-per-clock offline testing. The test response compaction system is based on a chain of T flip-flops. The T flip-flop signature chain can preserve the information about the position of the first occurrence of the erroneous test response and the information about the clock cycle...
The paper discusses possibilities of rearranging test decompress or internal structure and linking its outputs with the parallel scan chain inputs in order to obtain better compression efficiency while the hardware overhead is not increased. We have experimentally verified that the controllability of decompress or outputs can be used as a simple and easily computable measure of the decompress or efficiency...
The paper presents a test pattern compression method for circuits with a high number of parallel scan chains. It reduces test time while it keeps hardware overhead low. The decompression method is based on the continuous LFSR reseeding that is used in such a way that it enables LFSR lockout escaping within a small number of clock cycles. It requires a separate controlling of the LFSR decompressor...
The paper describes a modified Smart BIST methodology that provides test data volume compression. The test equipment is easily applicable because it is based on the standard scan methodology. The method is based on continuous LFSR reseeding decompression that is used in such a way that it enables lockout escaping within a small number of clock cycles. It requires a separate controlling of the LFSR...
The paper deals with the problem of test data volume, decompressor hardware overhead and test application time of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements...
The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application...
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