Search results for: H. Kim
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
2016 IEEE SENSORS > 1 - 3
2015 IEEE International Electron Devices Meeting (IEDM) > 26.3.1 - 26.3.4
2013 IEEE International Electron Devices Meeting > 29.2.1 - 29.2.4
2013 IEEE International Electron Devices Meeting > 2.7.1 - 2.7.4
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
IEEE Journal of Solid-State Circuits > 2013 > 48 > 2 > 598 - 610
2010 International Electron Devices Meeting > 12.6.1 - 12.6.4
2010 International Electron Devices Meeting > 26.6.1 - 26.6.4
Fungal Biology > 2010 > 114 > 10 > 817-824