Search results for: Y. Yu
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1203 - 1208
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 3505 - 3508
IEEE Electron Device Letters > 2011 > 32 > 9 > 1173 - 1175
2010 International Electron Devices Meeting > 11.6.1 - 11.6.4
Physica C: Superconductivity and its applications > 1997 > 289 > 3-4 > 199-202