Search results for: A. Pérez-Tomás
Journal of Electronic Materials > 2015 > 44 > 11 > 4167-4174
IEEE Journal of the Electron Devices Society > 2014 > 2 > 5 > 114 - 117
Materials Science in Semiconductor Processing > 2013 > 16 > 5 > 1336-1345
Microelectronics Reliability > 2012 > 52 > 11 > 2547-2550
Microelectronics Reliability > 2012 > 52 > 9-10 > 2220-2223
Microelectronic Engineering > 2011 > 88 > 10 > 3140-3144
Microelectronics Reliability > 2011 > 51 > 8 > 1325-1329
Solid State Electronics > 2011 > 56 > 1 > 201-206
Surface Science > 2010 > 604 > 1 > 63-67
Materials Science & Engineering B > 2009 > 165 > 1-2 > 15-17
Applied Surface Science > 2009 > 255 > 12 > 6057-6060
2008 International Semiconductor Conference > 1 > 53 - 59