Search results for: S.E. Tyaginov
Current Applied Physics > 2015 > 15 > 2 > 78-83
2014 IEEE International Reliability Physics Symposium > XT.13.1 - XT.13.6
Materials Science in Semiconductor Processing > 2010 > 13 > 5-6 > 405-410
Microelectronics Reliability > 2010 > 50 > 9-11 > 1267-1272
Thin Solid Films > 2008 > 516 > 23 > 8740-8744
Microelectronic Engineering > 2007 > 84 > 9-10 > 2247-2250
Microelectronics Reliability > 2007 > 47 > 4-5 > 669-672
Microelectronics Reliability > 2006 > 46 > 7 > 1035-1041
Microelectronics Journal > 2006 > 37 > 2 > 114-120
Microelectronic Engineering > 2006 > 83 > 2 > 376-380
Solid State Electronics > 2005 > 49 > 7 > 1192-1197
Microelectronics Reliability > 2004 > 44 > 3 > 543-546
Materials Science in Semiconductor Processing > 2000 > 3 > 5-6 > 539-543