Search results for: C. Busseret
Microelectronics Reliability > 2007 > 47 > 4-5 > 631-634
Microelectronics Reliability > 2007 > 47 > 4-5 > 729-732
IEEE Transactions on Electron Devices > 2007 > 54 > 1 > 106 - 114
Solid State Electronics > 2006 > 50 > 7-8 > 1310-1314
Solid State Electronics > 2006 > 50 > 5 > 769-773
Solid State Electronics > 2006 > 50 > 2 > 134-141
Materials Science & Engineering B > 2003 > 102 > 1-3 > 99 - 107
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 240-245
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 191-198
Physica E: Low-dimensional Systems and Nanostructures > 2003 > 17 > Complete > 604-606
Physica E: Low-dimensional Systems and Nanostructures > 2003 > 16 > 3-4 > 326-330
Materials Science & Engineering C > 2002 > 19 > 1-2 > 237-241
Microelectronic Engineering > 2002 > 61-62 > 511-515
Superlattices and Microstructures > 2000 > 28 > 5-6 > 493-500
Applied Surface Science > 2000 > 164 > 1-4 > 29-34