Search results for: C.-K. Hu
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 446 - 451
2014 IEEE International Reliability Physics Symposium > 5A.3.1 - 5A.3.7
2012 International Electron Devices Meeting > 33.7.1 - 33.7.4
Microelectronic Engineering > 2012 > 92 > Complete > 62-66
Thin Solid Films > 2006 > 504 > 1-2 > 274-278
Microelectronics Reliability > 2006 > 46 > 2-4 > 213-231
Microelectronic Engineering > 2003 > 70 > 2-4 > 398-405
Microelectronic Engineering > 2003 > 70 > 2-4 > 406-411
Thin Solid Films > 2001 > 388 > 1-2 > 303-314