Search results for: D. Dallet
Measurement > 2008 > 41 > 9 > 986-993
IET Science, Measurement & Technology > 2008 > 2 > 1 > 1 - 8
IEEE Transactions on Circuits and Systems II: Express Briefs > 2008 > 55 > 4 > 344 - 348
2007 IEEE Nuclear Science Symposium Conference Record > 4 > 2489 - 2493
2007 IEEE Northeast Workshop on Circuits and Systems > 1449 - 1452