Search results for: C.D. Young
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.1.1 - XT.1.4
IEEE Electron Device Letters > 2008 > 29 > 2 > 180 - 182
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131