Search results for: R. Thamankar
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-4-1 - 7A-4-7
Microelectronics Reliability > 2015 > 55 > 9-10 > 1450-1455
Journal of Magnetism and Magnetic Materials > 2005 > 290-291 > Part 1 > 213-215
Journal of Magnetism and Magnetic Materials > 2005 > 290-291 > Part 1 > 216-218
Journal of Magnetism and Magnetic Materials > 2004 > 281 > 2-3 > 206-213
Journal of Magnetism and Magnetic Materials > 2004 > 272-276 > Supplement > E779-E780
Journal of Magnetism and Magnetic Materials > 2004 > 272-276 > Part 2 > 1196-1197